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作者:

Qin, Fei (Qin, Fei.) (学者:秦飞) | Bai, Jie (Bai, Jie.) | An, Tong (An, Tong.)

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摘要:

A 3-D finite element model of board level BGA package was built and the Input-G method was used to analyze dynamic solder joint stress in the package during drop/impact. Boundary condition, bolt effects of the test board and peeling stress mechanism were emphasized in current investigation. An equivalent static model that can evaluate stress quickly was proposed. The results show that bolt constraints have a significant influence on the dynamic stress in solder joints. The bolt constraints must be treated as zero horizontal displacement in the area the bolt acted in the numerical model. The stress in the solder joint reaches its peak at 0.4 ms and the maximum peeling stress is located at the most outer corner of the package. The peeling stress is dominated by the deflection of the PCB board. The equivalent static model predicts the same stress distribution in the package but overestimates the stress about 23%.

关键词:

Boundary conditions Dynamics Electronics packaging Finite element method Impact testing Mathematical models Peeling Printed circuit boards Reliability Soldered joints Stress analysis

作者机构:

  • [ 1 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Bai, Jie]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China

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来源 :

Journal of Beijing University of Technology

ISSN: 0254-0037

年份: 2007

期: 10

卷: 33

页码: 1038-1043

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