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作者:

Wang, Ting (Wang, Ting.) | Guo, Xia (Guo, Xia.) (学者:郭霞) | Fang, Yuan (Fang, Yuan.) | Liu, Bin (Liu, Bin.) | Shen, Guang-Di (Shen, Guang-Di.)

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摘要:

GaN thin films grown on sapphire substrates are successfully bonded and transferred onto Si receptor substrates using fusion bonding and laser lift-off (LLO) technique. The GaN/Al2O3 structures are joined on Si substrates by pressure bonding Al/Ti/Au coated GaN surfaces onto Ti/Au/In coated Si receptor substrates at the temperature of 200°C. KrF excimer laser with 450 mJ/cm2 energy density, 248 nm wavelength and 25ns pulse width is used to direct through the transparent sapphire substrates to separate GaN films from sapphire substrates. Scanning electron microscope (SEM) images show that compact GaN/Al/Ti/Au/In/Au/Ti/Si structures are formed during bonding process. Atomic force microscope (AFM) and photoluminescence (PL) measurements show that the qualities of GaN films on Si substrates degrade little after substrate transfer.

关键词:

Atomic force microscopy Bonding Gallium nitride Optical properties Photoluminescence Scanning electron microscopy Thin films

作者机构:

  • [ 1 ] [Wang, Ting]School of Mechatronic Engineering, Beijing Institute of Technology, Beijing 100081, China
  • [ 2 ] [Wang, Ting]Institute of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Guo, Xia]Institute of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Fang, Yuan]Institute of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Liu, Bin]Institute of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Shen, Guang-Di]Institute of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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来源 :

Journal of Functional Materials

ISSN: 1001-9731

年份: 2007

期: 1

卷: 38

页码: 88-90

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