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Author:

Gao, Pan (Gao, Pan.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Qiu, Jian-Jun (Qiu, Jian-Jun.) | Yang, Jing-Wei (Yang, Jing-Wei.) | Jin, Dong-Yue (Jin, Dong-Yue.) | Xie, Hong-Yun (Xie, Hong-Yun.) | Zhang, Jing (Zhang, Jing.) | Zhang, Zheng-Yuan (Zhang, Zheng-Yuan.) | Liu, Dao-Guang (Liu, Dao-Guang.) | Wang, Jian-An (Wang, Jian-An.) | Xu, Xue-Liang (Xu, Xue-Liang.)

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Abstract:

Width scaling, length scaling, base stripe-number scaling and distance between emitter and base scaling effect on high-frequency noise in SiGe HBTs are quantified from an experimental perspective. Results show that the increase of emitter length, base stripe number, and the decrease of distance between emitter and base are proved to be effective ways to improve noise performance of SiGe HBTs. Particularly, the effect of the last method is remarkably good. As the distance reduces from 1 μm to 0.5 μm, the minimum noise figure can be reduced by 9 dB at 2 GHz and reaches 1.5 dB at 0.5 GHz and 3 dB at 2 GHz.

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Source :

Journal of Functional Materials and Devices

ISSN: 1007-4252

Year: 2007

Issue: 5

Volume: 13

Page: 495-498

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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