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作者:

Gao, Zhi-Hua (Gao, Zhi-Hua.) | Chen, Guang-Hua (Chen, Guang-Hua.) | Li, Zhi-Zhong (Li, Zhi-Zhong.) | Deng, Jin-Xiang (Deng, Jin-Xiang.) (学者:邓金祥) | Ding, Yi (Ding, Yi.)

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摘要:

The preparation of cubic boron nitride films by using electron-cyclotron-resonance-enhanced-microwave-plasma chemical vapor deposition (MW-ECR CVD). We put forward the qualitative analysis of influences of the flux of N2 and H2 on the configuration of cubic boron nitride films by Fourier transform infrared spectrometry (FTIR). It was found that H2 played an important role on the configuration of cubic boron nitride films in the BF3-H2-N2-Ar gaseous system. But N2 didn't show obvious infection. We analyzed the characteristic of the configuration of cubic boron nitride films prepared by MW-ECR CVD in primary.

关键词:

Chemical vapor deposition Cubic boron nitride Film preparation Fourier transform infrared spectroscopy Semiconducting films

作者机构:

  • [ 1 ] [Gao, Zhi-Hua]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Chen, Guang-Hua]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Li, Zhi-Zhong]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Deng, Jin-Xiang]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Ding, Yi]School of Physics, Lanzhou University, Lanzhou 730000, China

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来源 :

Journal of Functional Materials

ISSN: 1001-9731

年份: 2006

期: SUPPL.

卷: 37

页码: 208-210

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