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作者:

Deng, Jinxiang (Deng, Jinxiang.) (学者:邓金祥) | Chen, Hao (Chen, Hao.) | Liu, Junkai (Liu, Junkai.) | Tian, Ling (Tian, Ling.) | Zhang, Yan (Zhang, Yan.) | Zhou, Tao (Zhou, Tao.) | He, Bin (He, Bin.) | Chen, Guanghua (Chen, Guanghua.) | Wang, Bo (Wang, Bo.) (学者:王波) | Yan, Hui (Yan, Hui.)

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摘要:

The sulfur doping of boron nitride films usually adopts an in-situ doping control technique during their deposition processes. In this paper the sulfur doping of boron nitride films is realized through ion implantation. Experiment results show that the boron nitride films of sulfur ion implantation are n-type. The resistivity of the boron nitride films decrease with increasing sulfur ion implantation dose. Annealing of the implanted boron nitride films results in increasing their doping effect. The resistivity of the film implanted at the dose of 1016cm-2 and annealed at 600°C for 60min is 2.20 × 105Ω·cm, which is 6 orders lower than that of the un-implanted film.

关键词:

Annealing Cubic boron nitride Doping (additives) Electric properties Film preparation Ion implantation Magnetron sputtering Thin films

作者机构:

  • [ 1 ] [Deng, Jinxiang]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Chen, Hao]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Liu, Junkai]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Tian, Ling]School of Physics, Lanzhou University, Lanzhou 730000, China
  • [ 5 ] [Zhang, Yan]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Zhou, Tao]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing 100022, China
  • [ 7 ] [He, Bin]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 8 ] [Chen, Guanghua]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 9 ] [Wang, Bo]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 10 ] [Yan, Hui]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China

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来源 :

Chinese Journal of Semiconductors

ISSN: 0253-4177

年份: 2006

期: SUPPL.

卷: 27

页码: 127-130

被引次数:

WoS核心集被引频次: 0

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ESI高被引论文在榜: 0 展开所有

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