A　set　of　feasible　solution　to　testing　ELAB　2451　40　MHz,　10　bit　analog-to-digital　converter　static　parameters　applied　to　base　band　chip　for　802.　11　g　WLAN,　which　belongs　to　Beijing　Embedded　System　Key　Lab,　is　provided　by　this　paper.　Firstly　and　theoretically,　the　principle　of　code　density　histogram　testing　is　interpreted.　Secondly,　a　more　robust　accumulated　code　density　testing　method,　independent　of　input　sine　wave　signal　magnitude　variations,　is　offered　and　utilized　to　serve　as　a　solution.　Finally,　validity　and　accuracy　of　this　scheme　are　verified　by　testing　AD　9218　from　Analog　Device,　Inc.　The　results　satisfy　all　parameter　requirements.