Method to measure cavity loss of LD - 文章详情页

作者：

Shu, Xiong-Wen (Shu, Xiong-Wen.) | Xu, Chen (Xu, Chen.) (学者：徐晨) | Tian, Zeng-Xia (Tian, Zeng-Xia.) | Shen, Guang-Di (Shen, Guang-Di.)

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摘要：

A　new　method　was　put　forwards　to　measure　the　cavity　loss　of　LD.　By　depositing　high　reflection　layers　on　the　rear　facet　and　anti-reflection　layers　on　the　front　facet　of　the　LD,　and　using　the　linear　relation　between　1/ηe　and　1/In[1/RfRr]　(Rf　and　Rr　are　the　front　facet　and　rear　facet　reflection,　respectively),　the　method　eliminates　the　error　induced　by　using　the　usually　used　way.　It　makes　the　value　more　accurate　and　reduces　the　error　as　much　as　15%.

关键词：

Absorption Antireflection coatings Deposition Diodes Errors Losses Quantum efficiency Reflection

作者机构：

[ 1 ] [Shu, Xiong-Wen]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 2 ] [Xu, Chen]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 3 ] [Tian, Zeng-Xia]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 4 ] [Shen, Guang-Di]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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电子邮件地址：

xwshu@emails.bjut.edu.cn

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