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作者:

Cong, Hongxia (Cong, Hongxia.) | Feng, Liefeng (Feng, Liefeng.) | Wang, Jun (Wang, Jun.) | Zhu, Chuanyun (Zhu, Chuanyun.) | Wang, Cunda (Wang, Cunda.) | Xie, Xuesong (Xie, Xuesong.) | Lu, Changzhi (Lu, Changzhi.)

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摘要:

The dependence of series resistance, ideality factor, junction voltage, and capacitance on the applied voltage or current of laser diodes (LDs) is determined by examining forward AC behavior together with I-V characteristics. The experimental results, for the first time, demonstrate that the junction voltage saturation occurs after the junction voltage, series resistance, ideality factor, and junction capacitance simultaneously show step offsets near the threshold. A negative capacitance effect in LDs is also observed under larger voltages or lower frequencies.

关键词:

Capacitance Current voltage characteristics Diodes Electric potential Electric resistance Lasers Measurements Semiconductor junctions Threshold voltage

作者机构:

  • [ 1 ] [Cong, Hongxia]Department of Applied Physics, Tianjin University, Tianjin 300072, China
  • [ 2 ] [Feng, Liefeng]Department of Applied Physics, Tianjin University, Tianjin 300072, China
  • [ 3 ] [Wang, Jun]Department of Applied Physics, Tianjin University, Tianjin 300072, China
  • [ 4 ] [Zhu, Chuanyun]Department of Applied Physics, Tianjin University, Tianjin 300072, China
  • [ 5 ] [Wang, Cunda]Department of Applied Physics, Tianjin University, Tianjin 300072, China
  • [ 6 ] [Xie, Xuesong]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 7 ] [Lu, Changzhi]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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来源 :

Chinese Journal of Semiconductors

ISSN: 0253-4177

年份: 2006

期: 1

卷: 27

页码: 105-109

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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