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摘要:
a-Si:H films were grown by hot filament assisted microwave electron synchrotron resonance chemical vapor deposition. We found that hot filament assistance increases the deposition rate and considerably improves the film stability; and that the deposition rate increase with the increase of the filament temperature and the pressure. In light-induced degradation, infrared absorption spectra were analyzed with baseline fitting and Gaussian data fitting. The results show that while hydrogen content remains unchanged, the relative contents of Si-H and Si-H2 bonding modes changes.
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来源 :
Journal of Vacuum Science and Technology
ISSN: 1672-7126
年份: 2006
期: SUPPL.
卷: 26
页码: 67-70