The　measurement　of　modulation　transfer　function　(MTF)　of　the　sampled　imaging　opto-electronic　system　is　rather　complex　and　irrepeatable　for　its　shift-variant　characteristics.　Based　on　the　theory　of　statistical　optics　and　stochastic　process,　the　correlation　relationship　of　spatially　discrete　random　signal　pattern　and　its　corresponding　image　through　a　linear　optical　imaging　system　are　analyzed.　A　method　using　random　bar　pattern　for　modulation　transfer　function　measurement　is　proposed,　and　the　emulational　experimental　result　is　demonstrated.　The　random　bar　pattern　test　method　reduces　the　effect　of　sample-scene　phasing　of　sampled　imaging　device　in　statistical　sense.　This　method　is　also　adapted　to　the　MTF　measurement　of　commonly　shift-invariant　optical　system　and　is　expected　to　greatly　improve　the　flexibilities　and　automation　degree　of　MTF　testing.