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作者:

Lu, Changzhi (Lu, Changzhi.) | Feng, Shiwei (Feng, Shiwei.) (学者:冯士维) | Wang, Dongfeng (Wang, Dongfeng.) | Zhang, Xiaoling (Zhang, Xiaoling.) | Xie, Xuesong (Xie, Xuesong.) | He, Yan (He, Yan.) | Zhang, Hao (Zhang, Hao.) | Xu, Liguo (Xu, Liguo.) | Yuan, Mingwen (Yuan, Mingwen.) | Li, Xiaobai (Li, Xiaobai.) | Zeng, Qingming (Zeng, Qingming.)

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摘要:

By the compared studies on the three AlGaN/GaN heterojunction field effect transistor (HFET) structures with normal, inverted, and double heterostructure, it is found that the normal structure is the most simple one and is easily controllable for layer growth. The characteristics of inverted structure are poorer than that with normal structure, and those characteristics with double heterostructure are better than that with normal and inverted structure, but its layer growth is much more complicated.

关键词:

Field effect transistors Gallium nitride Heterojunctions Molecular beam epitaxy Performance Semiconducting aluminum compounds Structure (composition)

作者机构:

  • [ 1 ] [Lu, Changzhi]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Feng, Shiwei]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Wang, Dongfeng]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Zhang, Xiaoling]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Xie, Xuesong]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [He, Yan]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 7 ] [Zhang, Hao]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 8 ] [Xu, Liguo]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 9 ] [Yuan, Mingwen]13th Institute, China Electronic Technology Group Corporation, Shijiazhuang 050051, China
  • [ 10 ] [Li, Xiaobai]13th Institute, China Electronic Technology Group Corporation, Shijiazhuang 050051, China
  • [ 11 ] [Zeng, Qingming]13th Institute, China Electronic Technology Group Corporation, Shijiazhuang 050051, China

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来源 :

Chinese Journal of Semiconductors

ISSN: 0253-4177

年份: 2005

期: SUPPL.

卷: 26

页码: 155-157

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

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