Determination of the polarity of ZnO thin films by electron energy-loss spectroscopy - 文章详情页

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EI Scopus

摘要：

The　polarity　of　the　ZnO　film　grown　on　sapphire　using　an　ultra-thin　Ga　wetting　layer　has　been　investigated　by　electron　energy-loss　spectroscopy　(EELS).　The　intensity　of　the　oxygen　K-edge　in　electron　energy-loss　spectrum　from　the　ZnO　film　shows　a　prominent　difference　when　the　film　orientation　changes　from　the　(0002)　Bragg　condition　to　the　(0002)　Bragg　condition.　The　EELS　study　reveals　that　the　ZnO　film　with　very　thin　Ga　wetting　layer　has　the　[0001]　polarity,　which　is　further　confirmed　by　the　conventional　convergent　beam　electron　diffraction　method.　©　2003　Elsevier　B.V.　All　rights　reserved.

关键词：

Gallium Thin films Sapphire Electron scattering Zinc oxide Electron energy levels Energy dissipation II-VI semiconductors Oxide minerals Electron emission Wetting Electrons Electron diffraction Electron energy loss spectroscopy Metallic films Dissociation

作者机构：

[ 1 ] [Wang, Y.]Beijing Lab. of Electron Microscopy, Inst. Phys./Ctr. Condensed Matter P., Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, China
[ 2 ] [Xu, Q.Y.]Beijing Lab. of Electron Microscopy, Inst. Phys./Ctr. Condensed Matter P., Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, China
[ 3 ] [Du, X.L.]State Key Lab. for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
[ 4 ] [Mei, Z.X.]State Key Lab. for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
[ 5 ] [Zeng, Z.Q.]State Key Lab. for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
[ 6 ] [Xue, Q.K.]State Key Lab. for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
[ 7 ] [Zhang, Z.]Beijing Lab. of Electron Microscopy, Inst. Phys./Ctr. Condensed Matter P., Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, China
[ 8 ] [Zhang, Z.]Beijing University of Technology, 100 Pingle Yuan, Chao Yang District, Beijing 100022, China

通讯作者信息：

[wang, y.]beijing lab. of electron microscopy, inst. phys./ctr. condensed matter p., chinese academy of sciences, p.o. box 603, beijing 100080, china

电子邮件地址：

ywang@blem.ac.cn

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