Research on Online Junction Temperature Measurement of MOSFET Devices - 文章详情页

作者：

Jiang, Bo-Yang (Jiang, Bo-Yang.) | Guo, Chun-Sheng (Guo, Chun-Sheng.) | Luo, Lin (Luo, Lin.)

收录：

EI Scopus

摘要：

In　order　to　detect　the　MOSFET　junction　temperature,　the　paper　measures　the　MOSFET　junction　temperature　by　electrical　method　without　affecting　the　normal　operation　of　the　devices　and　the　circuits.　In　addition,　the　method　of　optimizing　the　temperature　calibration　curve　proposed　is　helpful　for　engineers　to　efficiently　monitor　the　junction　temperature　and　prevent　the　risk　of　failure　caused　by　high　temperature.　©　2019　IOP　Publishing　Ltd.　All　rights　reserved.

关键词：

Image processing Intelligent computing MOSFET devices Temperature measurement

作者机构：

[ 1 ] [Jiang, Bo-Yang]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
[ 2 ] [Guo, Chun-Sheng]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
[ 3 ] [Luo, Lin]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China

通讯作者信息：

电子邮件地址：

查看成果更多字段

成果类型
所属机构

所有年份指定年份从至