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For the first time, this paper reveals and explains the details how to comprehend and deduce the evolution of current filaments in FRD by the negative resistance phenomenon presented in reverse recovery I-V curve. Further study on simulation data shows that the curve shape of voltage clamping period is caused by the generation of solitary filaments, and the definite correspondence relationship of them is discussed. © 2019 IEEE.
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年份: 2019
语种: 英文
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