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Author:

Peng, Chen-Wei (Peng, Chen-Wei.) | Lei, Chao (Lei, Chao.) | Ruan, Tianyu (Ruan, Tianyu.) | Zhong, Jun (Zhong, Jun.) | Yang, Miao (Yang, Miao.) | Long, Wei (Long, Wei.) | Yu, Cao (Yu, Cao.) | Li, Yuanmin (Li, Yuanmin.) | Xu, Xixiang (Xu, Xixiang.)

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EI

Abstract:

In this paper, we investigated the application of n-type hydrogenated microcrystalline silicon oxide (n-μcSiOx:H) as the front surface field (FSF) to improve the shortcircuit current density (JSC) of silicon heterojunction (SHJ) solar cells. The advantage of employing n-μc-SiOx:H layer is due to its low optical absorption coefficient and tunable refractive index. However, the SHJ solar cell performance was otherwise limited by the amorphous oxygen alloyed silicon-based films which probably deteriorate the incubation stage of the n-μc-SiOx:H layer. To reduce amorphous/microcrystalline mixture phase during the growth, we implemented high phosphorus-doped seed layer deposited prior to n-μc-SiOx:H layer with refractive indices in the range of 2.7 to 2.9. Finally, optimization of the nμc-SiOx:H layer led to a conversion efficiency of 23.9%, with JSC of 39.1mA/cm2, open circuit voltage (VOC) of 740mV, and fill factor (FF) of 82.6%. © 2019 IEEE.

Keyword:

Silicon solar cells Silicon oxides Heterojunctions Refractive index Microcrystalline silicon Microcrystals Light absorption Amorphous alloys Open circuit voltage Semiconductor doping Phosphorus Amorphous silicon Silicon compounds

Author Community:

  • [ 1 ] [Peng, Chen-Wei]Chengdu Zhufeng Yongming Technology Co., Ltd, Chengdu, Sichuan; 610200, China
  • [ 2 ] [Lei, Chao]Sichuan University, College of Material Science and Engineering, Chengdu, Sichuan; 610065, China
  • [ 3 ] [Ruan, Tianyu]Beijing University of Technology, College of Materials Science and Engineering, Beijing; 100124, China
  • [ 4 ] [Zhong, Jun]Chengdu Zhufeng Yongming Technology Co., Ltd, Chengdu, Sichuan; 610200, China
  • [ 5 ] [Yang, Miao]Chengdu Zhufeng Yongming Technology Co., Ltd, Chengdu, Sichuan; 610200, China
  • [ 6 ] [Long, Wei]Chengdu Zhufeng Yongming Technology Co., Ltd, Chengdu, Sichuan; 610200, China
  • [ 7 ] [Yu, Cao]Chengdu Zhufeng Yongming Technology Co., Ltd, Chengdu, Sichuan; 610200, China
  • [ 8 ] [Li, Yuanmin]Chengdu Zhufeng Yongming Technology Co., Ltd, Chengdu, Sichuan; 610200, China
  • [ 9 ] [Xu, Xixiang]Chengdu Zhufeng Yongming Technology Co., Ltd, Chengdu, Sichuan; 610200, China

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Source :

ISSN: 0160-8371

Year: 2019

Page: 2550-2553

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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