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作者:

Wan, M. (Wan, M..) | Cibiraite, D. (Cibiraite, D..) | Li, B. (Li, B..) | Yuan, H. (Yuan, H..) | Krozer, V. (Krozer, V..) | Roskos, H. (Roskos, H..) | Wang, D. (Wang, D..) | Sheridan, J.T. (Sheridan, J.T..)

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摘要:

Terahertz (THz) confocal scanning microscopy is the combination of THz technology and confocal scanning microscopy. Here, we present a conventional confocal THz imaging system with transmission configuration, which is implemented using an 300 GHz electronic terahertz source and a GaAs terahertz camera. The polarization and sectioning characterization are demonstrated by utilizing a 2 mm resolution test stipes. The resulting images show consistently good resolution. © 2019 IEEE.

关键词:

Gallium arsenide III-V semiconductors Terahertz waves Polarization

作者机构:

  • [ 1 ] [Wan, M.]School of Electrical Electronic Engineering, University College Dublin, Belfield, Dublin 4, Ireland
  • [ 2 ] [Cibiraite, D.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
  • [ 3 ] [Li, B.]College of Applied Sciences, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Yuan, H.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
  • [ 5 ] [Krozer, V.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
  • [ 6 ] [Krozer, V.]Department of Excellence, University Carlos III Madrid, Madrid, Spain
  • [ 7 ] [Roskos, H.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
  • [ 8 ] [Wang, D.]College of Applied Sciences, Beijing University of Technology, Beijing; 100124, China
  • [ 9 ] [Sheridan, J.T.]School of Electrical Electronic Engineering, University College Dublin, Belfield, Dublin 4, Ireland

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ISSN: 2162-2027

年份: 2019

卷: 2019-September

语种: 英文

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