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作者:

Weiling, Guo (Weiling, Guo.) | Shuai, D.U. (Shuai, D.U..) | Changqing, Bai (Changqing, Bai.) | Liang, Lei (Liang, Lei.) | Yanxu, Zhu (Yanxu, Zhu.)

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EI Scopus

摘要:

In order to improve the stability of the GaN FET power driven integrated circuit, the integrated circuits usually design corresponding protective circuit modules, such as overcurrent, over temperature, under-voltage protection circuit, etc. In this paper, combined with the characteristics of GaN FET, based on the 0.18 m BiCMOS technique, a novel UVLO circuit used in GaN FET power driven integrated circuits is designed. The average temperature drift of turn on circuit voltage threshold(VDDTH+) is 0.12V, the maximum temperature drift is 0.481V, the average temperature drift of turn off threshold voltage(VDDTH-) is 0.03V, the maximum temperature drift is 0.142V; the VDDTH+ and VDDTH-are 4.241v and 3.885v; The hysteresis voltage is 356mv between VDDTH+ and VDDTH-, improved the circuit anti interference ability. The simulation results show that the circuit can output low voltage logic signals in under-voltage, and has low temperature drift and voltage hysteresis function, which has important significance for improving the performance of GaN FET power drive integrated circuit. © 2018 IEEE.

关键词:

Bismuth compounds Computer circuits Energy gap Gallium nitride Hysteresis III-V semiconductors Integrated circuit design Integrated circuits Lighting MISFET devices Surge protection Temperature Threshold voltage Timing circuits Wide band gap semiconductors

作者机构:

  • [ 1 ] [Weiling, Guo]Ministry of Education, Beijing University of Technology, Beijing University of Technology, Key Laboratory of Opto-electronics Technology, No. 100, Pingleyuan, Chaoyang District, Beijing; 100124, China
  • [ 2 ] [Shuai, D.U.]Ministry of Education, Beijing University of Technology, Beijing University of Technology, Key Laboratory of Opto-electronics Technology, No. 100, Pingleyuan, Chaoyang District, Beijing; 100124, China
  • [ 3 ] [Changqing, Bai]Ministry of Education, Beijing University of Technology, Beijing University of Technology, Key Laboratory of Opto-electronics Technology, No. 100, Pingleyuan, Chaoyang District, Beijing; 100124, China
  • [ 4 ] [Liang, Lei]Ministry of Education, Beijing University of Technology, Beijing University of Technology, Key Laboratory of Opto-electronics Technology, No. 100, Pingleyuan, Chaoyang District, Beijing; 100124, China
  • [ 5 ] [Yanxu, Zhu]Ministry of Education, Beijing University of Technology, Beijing University of Technology, Key Laboratory of Opto-electronics Technology, No. 100, Pingleyuan, Chaoyang District, Beijing; 100124, China

通讯作者信息:

  • [weiling, guo]ministry of education, beijing university of technology, beijing university of technology, key laboratory of opto-electronics technology, no. 100, pingleyuan, chaoyang district, beijing; 100124, china

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年份: 2018

页码: 38-41

语种: 英文

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SCOPUS被引频次: 3

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