Research on IGBT junction temperature measurement via pre-threshold voltage method based on FPGA control - 文章详情页

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EI Scopus

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In　order　to　provide　good　experimental　environment　for　insulated　gate　bipolar　transistor　(IGBT)　and　solve　its　junction　temperature　measurement　problem　in　the　power　cycle　system,　the　IGBT　pre-threshold　voltage　is　used　as　a　temperature　sensitive　parameter　in　this　paper.　The　experimental　platform　is　built　based　on　FPGA　as　a　control　core　unit　to　realize　multi-channel　IGBT　junction　temperature.　Considering　the　influence　of　IGBT　trailing　current,　according　to　the　different　operating　currents　of　the　device,　the　optimal　turn-off　duration　corresponding　to　each　operating　current　is　determined　to　reduce　the　influence　of　turn-off　duration　on　the　normal　operation　of　the　device.　The　experimental　results　show　that　determining　reasonable　turn-off　duration　can　effectively　measure　IGBT　junction　temperature　and　improve　the　efficiency　of　the　system.　©　2018　IEEE.

关键词：

Field programmable gate arrays (FPGA) Insulated gate bipolar transistors (IGBT) Temperature measurement Threshold voltage

作者机构：

[ 1 ] [Huo, Yu-Qian]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
[ 2 ] [Zhang, Xiao-Ling]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
[ 3 ] [Xie, Xue-Song]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
[ 4 ] [Guo, Meng]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
[ 5 ] [Qi, Shuai-Bing]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
[ 6 ] [Hu, Dong-Dong]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China

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