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作者:

Lin, Jiachun (Lin, Jiachun.) | Bergstedt, Edwin (Bergstedt, Edwin.) | Lindholm, Per (Lindholm, Per.) | Shi, Zhaoyao (Shi, Zhaoyao.) (学者:石照耀) | Olofsson, Ulf (Olofsson, Ulf.)

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作者机构:

  • [ 1 ] [Lin, Jiachun]Beijing Univ Technol, Dept Instrument Sci & Technol, Beijing, Peoples R China
  • [ 2 ] [Shi, Zhaoyao]Beijing Univ Technol, Dept Instrument Sci & Technol, Beijing, Peoples R China
  • [ 3 ] [Lin, Jiachun]KTH Royal Inst Technol, Dept Machine Design, Stockholm, Sweden
  • [ 4 ] [Bergstedt, Edwin]KTH Royal Inst Technol, Dept Machine Design, Stockholm, Sweden
  • [ 5 ] [Lindholm, Per]KTH Royal Inst Technol, Dept Machine Design, Stockholm, Sweden
  • [ 6 ] [Olofsson, Ulf]KTH Royal Inst Technol, Dept Machine Design, Stockholm, Sweden
  • [ 7 ] [Lindholm, Per]ABB AB Corp Res, Vasteras, Sweden

通讯作者信息:

  • [Lin, Jiachun]Beijing Univ Technol, Dept Instrument Sci & Technol, Beijing, Peoples R China;;[Lin, Jiachun]KTH Royal Inst Technol, Dept Machine Design, Stockholm, Sweden

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来源 :

SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES

ISSN: 2051-672X

年份: 2019

期: 2

卷: 7

2 . 7 0 0

JCR@2022

ESI学科: PHYSICS;

ESI高被引阀值:123

JCR分区:3

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次:

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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