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作者:

Jiang, Chengshuo (Jiang, Chengshuo.) | Guo, Weiling (Guo, Weiling.) | Fan, Jiajie (Fan, Jiajie.) | Qian, Cheng (Qian, Cheng.) | Fan, Xuejun (Fan, Xuejun.) | Zhang, Guoqi (Zhang, Guoqi.)

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EI Scopus

摘要:

White light-emitting diodes (LED) are widely applied in many fields for its special advantages compared with other light sources. Chip-scale-package (CSP) is one of the hotspots in the research of microelectronics, and also the main stream and development direction to the future package technology. Within a CSP, the solder layer between LED chip and substrate is usually achieved via reflow processes. The weldability of solder layer with substrate directly determines CSP's reliability and service life. Therefore, optimizing reflow soldering process can improve the performance of solder layer, and improve the reliability of CSPs. The Sn-3.0Ag-0.5Cu (SAC305) has been widely used in high power LED CSPs for its good solderability and favorable shear strength. In this paper, the reflow soldering process for SAC305 is optimized, by considering the reflow profile, the volume of solder paste and the substrate materials, to improve the bonding strength between solder layer and substrate. Then the shear tests and simulation results are used to verify the mechanical performance of CSP solder layer. Finally, an optimized reflow process is proposed for white LED CSP packaging. The results show that the reflow temperature curve should be in an appropriate level, and the performance of the ceramic substrate is more suitable for the SAC305 solder paste than the aluminum substrate. © 2017 IEEE.

关键词:

Chip scale packages Copper alloys Light emitting diodes Microelectronics Silver alloys Soldering Substrates Tin alloys

作者机构:

  • [ 1 ] [Jiang, Chengshuo]College of Microelectronics, Beijing University of Technology, Beijing, China
  • [ 2 ] [Jiang, Chengshuo]Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, China
  • [ 3 ] [Guo, Weiling]College of Microelectronics, Beijing University of Technology, Beijing, China
  • [ 4 ] [Fan, Jiajie]Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, China
  • [ 5 ] [Fan, Jiajie]College of Mechanical and Electrical Engineering, Hohai University, Changzhou, China
  • [ 6 ] [Qian, Cheng]Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, China
  • [ 7 ] [Qian, Cheng]Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
  • [ 8 ] [Fan, Xuejun]Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, China
  • [ 9 ] [Fan, Xuejun]Department of Mechanical Engineering, Lamar University, Beaumont; TX, United States
  • [ 10 ] [Zhang, Guoqi]Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, China
  • [ 11 ] [Zhang, Guoqi]Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
  • [ 12 ] [Zhang, Guoqi]EEMCS Faculty, Delft University of Technology, Delft, Netherlands

通讯作者信息:

  • [guo, weiling]college of microelectronics, beijing university of technology, beijing, china

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年份: 2017

页码: 1309-1313

语种: 英文

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WoS核心集被引频次: 0

SCOPUS被引频次: 4

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