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Author:

Tang, Liu (Tang, Liu.) | Huang, Zhangqin (Huang, Zhangqin.) (Scholars:黄樟钦)

Indexed by:

EI Scopus

Abstract:

Architectural Vulnerability Factor (AVF) is an important metric to evaluate microprocessor reliability. Mechanistic methods for modeling AVF may reveal how program and micro-architecture influence AVF. Based on the constraints of program parallelism and machine parallelism for a superscalar out-of-order processor, we propose a mechanistic model with mathematical descriptions for instruction flow, and infer the AVF formulas by modeling instruction occupancy. Comparing with prior mechanistic models, the key novelty of this model is that it expands more mechanisms that hardware and software parameters correlate with AVF. This provides sufficient quantitative analysis of the relationships between parameters and AVF. We demonstrate that the model can be used to perform reliability-aware design space exploration instantaneously. © 2016, International Society of Science and Applied Technologies. All rights reserved.

Keyword:

Computer architecture Parallel processing systems Program processors Radiation hardening Reliability

Author Community:

  • [ 1 ] [Tang, Liu]Embedded Computing Institute, Beijing University of Technology, Beijing, China
  • [ 2 ] [Tang, Liu]College of Physics and Electronic Engineering, Guangxi Teachers Education University, Nanning, China
  • [ 3 ] [Huang, Zhangqin]Embedded Computing Institute, Beijing University of Technology, Beijing, China

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Source :

Year: 2016

Page: 317-323

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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