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A separate-absorption-charge-multiplication Ge/Si avalanche photodiode was designed. The devices have high dark current at low reverse bias, because of surface impurity and rough sidewall. A guard-ring structure and in-situ doping was introduced to decrease leakage-current. © OSA 2014
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ISSN: 2162-108X
年份: 2014
卷: 2014-November
语种: 英文