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Author:

Lin, Jian (Lin, Jian.) | Gao, Peng (Gao, Peng.) | Lei, Yongping (Lei, Yongping.) (Scholars:雷永平) | Wang, Lan (Wang, Lan.)

Indexed by:

EI Scopus

Abstract:

In SMT, it is not easy to study the failure process of solder joint under thermal-mechanical coupled fatigue loading. However, it is very important for the electrical circuit working in the thermal and vibration coupled environment. In this paper, the inelastic strain evolution in lead-free solder joint under thermal, mechanical, thermal-mechanical coupled fatigue loading was studied by numerical simulation, respectively. And the effect of amplitude and frequency of mechanical fatigue loading on inelastic strain in solder joint were investigated. It was shown that under thermal-mechanical coupled fatigue loading, there is a large value distribution of inelastic strain near the corner of the border between the chip and solder material. When the amplitude and frequency of mechanical fatigue loading are both small, the creep strain in solder joint is dominant. Otherwise, the plastic strain is larger than creep strain. © 2013 IEEE.

Keyword:

Lead-free solders Surface mount technology Thermal fatigue Electronics packaging Numerical models Creep Soldered joints

Author Community:

  • [ 1 ] [Lin, Jian]College of Materials Science and Engineering, Beijing University of Technology, Beijing, China
  • [ 2 ] [Gao, Peng]College of Materials Science and Engineering, Beijing University of Technology, Beijing, China
  • [ 3 ] [Lei, Yongping]College of Materials Science and Engineering, Beijing University of Technology, Beijing, China
  • [ 4 ] [Wang, Lan]College of Materials Science and Engineering, Beijing University of Technology, Beijing, China

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Source :

Year: 2013

Page: 937-940

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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