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作者:

Jin, D.Y. (Jin, D.Y..) | Hu, R.X. (Hu, R.X..) | Zhang, W.R. (Zhang, W.R..) | Lu, D. (Lu, D..) | Fu, Q. (Fu, Q..) | Zhang, Y.J. (Zhang, Y.J..)

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EI Scopus

摘要:

With the aid of the thermal model, thermal resistance matrix of emitter-segmented power HBT is proposed to represent thermal effects. The effect of 2-dimensional (2-D) inter-segment spacing on thermal stability of device is studied. It is shown that the increase of inter-segment spacing could effectively decrease thermal coupling resistance, lower temperature of center segments, and hence improves the thermal stability. Furthermore, a novel emitter-segmented power HBT with 2-D non-uniform segment spacing is proposed, in which the non-uniformity of segment temperature is improved by 75.26% and the maximum power level difference of emitter segment is improved by 55.84%, when compared with uniform segment spacing HBT. Therefore the technique of 2-D non-uniform segment spacing is a better method for enhancing the thermal stability of power HBTs. © (2013) Trans Tech Publications, Switzerland.

关键词:

Heterojunction bipolar transistors Machinery Thermodynamic stability

作者机构:

  • [ 1 ] [Jin, D.Y.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Hu, R.X.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Zhang, W.R.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Lu, D.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Fu, Q.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Zhang, Y.J.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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ISSN: 1660-9336

年份: 2013

卷: 313-314

页码: 737-741

语种: 英文

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