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作者:

Wang, Xuming (Wang, Xuming.) | Qin, Fei (Qin, Fei.) (学者:秦飞) | An, Tong (An, Tong.)

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摘要:

Tensile specimens with a Cu/IMC/solder/IMC/Cu structure were prepared, and were treated by 0h, 72h, 168h, 288h, 500h, 1000h isothermal aging processing at 150°C. Quasi-static tensile tests were conducted on the micro-tester Instron5948, Fracture analysis of fractured specimens was conducted by optical microscopy and scanning electron microscopy. Two fracture modes were found, and the fracturing surface tends to be flat with the aging time increases. © 2013 IEEE.

关键词:

Electronics packaging Fracture Lead-free solders Scanning electron microscopy Tensile testing

作者机构:

  • [ 1 ] [Wang, Xuming]China Electric Power Research Institute, Beijing, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 3 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China

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年份: 2013

页码: 861-864

语种: 英文

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WoS核心集被引频次: 0

SCOPUS被引频次: 1

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