A multi-channel charge readout IC with offset calibration for X-ray industrial inspection - 文章详情页

作者：

Wang, Xu (Wang, Xu.) | Yang, Hongyan (Yang, Hongyan.) | Yuan, Ying (Yuan, Ying.) | Wu, Wuchen (Wu, Wuchen.) (学者：吴武臣)

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EI Scopus

摘要：

A　multi-channel　charge　readout　integrated　circuit　(IC)　which　converts　detector　charge　to　analog　voltage　with　offset　calibration　for　X-ray　industrial　inspection　is　described.　The　charge　readout　IC　provides　64　channels　of　circuit　having　a　max　dynamic　range　of　14　bit　and　is　comprised　of　charge　amplifier　gain　control,　timing　generator,　shift　register　chain,　charge　amplifier　array,　sample/hold　(S/H)　stage　amplifier　and　driver　etc.　It　was　fabricated　using　0.8　um　standard　CMOS　process,　and　occupies　a　die　area　of　3.1　mm　×　10.9　mm.　It　operates　at　4　MHz,　consumes　45　mW　from　5　V　supply　and　3.5　V　as　reference,　and　has　a　demonstrated　output　noise　performance　of　600　uVrms　on　0.5　pF　of　charge　amplifier　gain　capacitance　and　33　pF　of　photodiode　(PD)　terminal　capacitance.　©　2012　IEEE.

关键词：

Shift registers Integrated circuits Capacitance Inspection Image processing Timing circuits X rays Calibration X ray detectors

作者机构：

[ 1 ] [Wang, Xu]VLSI and System Lab, Beijing University of Technology, Beijing, China
[ 2 ] [Yang, Hongyan]VLSI and System Lab, Beijing University of Technology, Beijing, China
[ 3 ] [Yuan, Ying]VLSI and System Lab, Beijing University of Technology, Beijing, China
[ 4 ] [Wu, Wuchen]VLSI and System Lab, Beijing University of Technology, Beijing, China

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