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作者:

Zhang Jiaying (Zhang Jiaying.) | Liu Xiucheng (Liu Xiucheng.) (学者:刘秀成) | Xiao Junwu (Xiao Junwu.) | Yang Zekun (Yang Zekun.) | Wu Bin (Wu Bin.) | He Cunfu (He Cunfu.) (学者:何存富)

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EI Scopus SCIE

摘要:

Both magnetic flux leakage (MFL) and magnetic field distortion (MFD) techniques are promising methods for surface defect detection in ferromagnetic components. The two techniques are based on different physical principles. However, their defect sizing and shape reconstruction abilities are seldom comparatively explored. In this study, finite element simulations and experiments were performed to achieve magnetic scanning imaging of a defective plate with both MFD and MFL techniques. First, the curves of voltage extracted from the lines crossing the center of cylindrical-hole defect (CHD) were used to evaluate the performance of several feature parameters in sizing the diameter and the depth of CHD. Second, the profiles of the normalized magnetic scanning imaging results were analyzed with a threshold plane to evaluate the abilities of MFD and MFL on reconstructing the shape of 8-shaped and cross-type through wall defects. Under the condition that the Hall device for measuring both the normal component of MFL and MFD has same lift-off distance as 1 mm, the MFD technique showed the advantages in defect shape reconstruction at the cost of available detection depth as compared with MFL techniques. (C) 2019 Elsevier B.V. All rights reserved.

关键词:

Magnetic field distortion Defect shape reconstruction Magnetic scanning imaging Magnetic flux leakage

作者机构:

  • [ 1 ] [Zhang Jiaying]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 2 ] [Liu Xiucheng]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 3 ] [Xiao Junwu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 4 ] [Wu Bin]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 5 ] [He Cunfu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 6 ] [Yang Zekun]Beijing Inst Control Engn, Beijing, Peoples R China

通讯作者信息:

  • 刘秀成

    [Liu Xiucheng]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China

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来源 :

SENSORS AND ACTUATORS A-PHYSICAL

ISSN: 0924-4247

年份: 2019

卷: 288

页码: 10-20

4 . 6 0 0

JCR@2022

ESI学科: ENGINEERING;

ESI高被引阀值:136

被引次数:

WoS核心集被引频次: 25

SCOPUS被引频次: 32

ESI高被引论文在榜: 0 展开所有

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