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作者:

An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) (学者:秦飞) | Wu, Wei (Wu, Wei.) | Yu, Daquan (Yu, Daquan.) | Wan, Lixi (Wan, Lixi.) | Wang, Jun (Wang, Jun.)

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EI Scopus

摘要:

The silicon layer containing through silicon vias (TSVs) is considered as anisotropic fiber reinforced composite layer with different longitudinal and transversal properties. An analytical approach is presented to estimate the effective Young's modulus, Poisson's ratio and coefficient of thermal expansion (CTE) for composite layer. It shows that the TSVs have no significant influence on the deflection of silicon layer, and the model ignoring TSVs is capable to predict enough accurate deflection of silicon layer. © 2012 IEEE.

关键词:

Three dimensional integrated circuits Elastic moduli Fiber reinforced plastics Thermal expansion Silicon Electronics packaging

作者机构:

  • [ 1 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Wu, Wei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Yu, Daquan]Institute of Microelectronics of Chinese Academy of Sciences, Beijing io0029, China
  • [ 5 ] [Wan, Lixi]Institute of Microelectronics of Chinese Academy of Sciences, Beijing io0029, China
  • [ 6 ] [Wang, Jun]Materials Science Department, Fudan University, Shanghai 200433, China

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年份: 2012

页码: 583-587

语种: 英文

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SCOPUS被引频次: 4

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