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作者:

Zhong, Weixu (Zhong, Weixu.) | Qin, Fei (Qin, Fei.) (学者:秦飞) | An, Tong (An, Tong.) | Liu, Chengyan (Liu, Chengyan.)

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摘要:

The growth of intermetallic compounds (IMC) at the Sn3.0Ag0.5Cu/Cu interface is investigated under aging temperature of 150 °C and aging time of 100, 300 and 500 hours. The relationship between the thickness of the IMC and aging time is fitted out, and the growth law of the IMC at Sn3.0Ag0.5Cu/Cu interface under isothermal aging condition is obtained. Mechanical properties of the Cu6Sn5 and Cu3Sn are obtained by a G200 nanoindentation tester. It indicates that with the Cu6Sn5 thickness increases, its Young's modulus and hardness have no change. The Young's modulus of Cu3Sn is greater than that of Cu 6Sn5, but the hardness of Cu3Sn is lower than that of Cu6Sn5. The nanoindentation experiments of the Sn3.0Ag0.5Cu/Cu interfacial zone show that the hardness of Cu, Cu3Sn, Cu6Sn5 and Sn3.0Ag0.5Cu has an order in magnitude of Cu6Sn5 > Cu3Sn > Cu Sn3.0Ag0.5Cu. © 2011 IEEE.

关键词:

Binary alloys Elastic moduli Electronics packaging Hardness Intermetallics Morphology Nanoindentation Packaging Silver alloys Ternary alloys Tin alloys

作者机构:

  • [ 1 ] [Zhong, Weixu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Liu, Chengyan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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年份: 2011

页码: 523-528

语种: 英文

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SCOPUS被引频次: 3

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