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作者:

Fu, Qiang (Fu, Qiang.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Jin, Dong-Yue (Jin, Dong-Yue.) | Xie, Hong-Yun (Xie, Hong-Yun.) | Xin, Zhao (Xin, Zhao.) | Wang, Ren-Qing (Wang, Ren-Qing.)

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EI Scopus

摘要:

Based on the electro-thermal feedback model for multi-finger power SiGe heterojunction bipolar transistor (SiGe HBT), this article analyzes the effect of base heavy doping on thermal characteristic of SiGe HBT. Because of the effect of base heavy doping, SiGe HBT will produce bandgap narrowing which decreases the collector current density and affects the device thermal distribution. By analyzing the thermal characteristic of multi-finger spacing SiGe HBT, we find that increasing base doping can decrease the current density and the temperature of emitter finger, which suppress the emitter finger thermoelectric positive feedback and improve the device thermal stability. © 2011 IEEE.

关键词:

Si-Ge alloys Feedback Heterojunction bipolar transistors Heterojunctions

作者机构:

  • [ 1 ] [Fu, Qiang]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Zhang, Wan-Rong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Jin, Dong-Yue]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Xie, Hong-Yun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Xin, Zhao]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Wang, Ren-Qing]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China

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年份: 2011

页码: 1365-1367

语种: 英文

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 1

ESI高被引论文在榜: 0 展开所有

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