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Author:

Li, Xue-Jing (Li, Xue-Jing.) | Yu, Dan (Yu, Dan.)

Indexed by:

EI Scopus

Abstract:

For the series systems whose components follow the exponential distribution, we put forward the reliability integrated acceptance test plan based on the components' information. Finally, we will provide a simulation example to demonstrate our method. © 2011 IEEE.

Keyword:

Acceptance tests

Author Community:

  • [ 1 ] [Li, Xue-Jing]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Yu, Dan]Academy of Mathematics and System Science, Chinese Academy of Science, Beijing 100190, China

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Source :

Year: 2011

Page: 339-344

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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