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Author:

Xu, Guangchen (Xu, Guangchen.) | Guo, Fu (Guo, Fu.) (Scholars:郭福) | Lee, Andre (Lee, Andre.) | Subramanian, K.N. (Subramanian, K.N..) | Wright, Neil (Wright, Neil.)

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EI Scopus

Abstract:

Basic understanding of heating conduction in lead-free solder joints due to the Joule heating effect was carried out by using the infrared (IR) microscopy. In order to interpret the corresponding mechanism and provide a better understanding to Electromigration (EM) studies, a newly developed ID solder joint with same cross-sectional area in solder alloy and Cu electrodes was employed in our thermal imaging analysis. Both eutectic SnBi and SnAgCu solder alloy were used to fabricate the joints due to their distinct electrical resistivity and thermal conductivity. Various electrical current inputs combined with joints' thickness of 500 μm were investigated. Accordingly, transient and steady-state heat conduction were identified and compared with different experimental conditions. © 2011 IEEE.

Keyword:

Tin alloys Heat conduction Soldered joints Copper alloys Packaging Electromigration Silver alloys Thermal conductivity Ternary alloys Binary alloys Lead-free solders Bismuth alloys Electronics packaging Infrared imaging Joule heating

Author Community:

  • [ 1 ] [Xu, Guangchen]College of Materials Science and Engineering, Beijing University of Technology, China
  • [ 2 ] [Guo, Fu]College of Materials Science and Engineering, Beijing University of Technology, China
  • [ 3 ] [Lee, Andre]Dept. of Chemical Engineering and Materials Science, Michigan State University, United States
  • [ 4 ] [Subramanian, K.N.]Dept. of Chemical Engineering and Materials Science, Michigan State University, United States
  • [ 5 ] [Wright, Neil]Dept. of Mechanical Engineering, Michigan State University, United States

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Source :

Year: 2011

Page: 464-467

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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