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作者:

Wu, Zhenxing (Wu, Zhenxing.) | Wu, Yu (Wu, Yu.) | Jia, Yunpeng (Jia, Yunpeng.) | Tian, Feifei (Tian, Feifei.) | Liu, Yin (Liu, Yin.) | Liu, Yueyang (Liu, Yueyang.)

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EI Scopus

摘要:

The fast recovery diodes (FRDs) are widely used in high frequency and high power applications. The forward characteristics of the FRDs, such as the forward voltage drop, are very important to determine the property of the FRDs. The forward characteristics of the FRD always greatly depend on the temperature. Here, in this paper, we researched some FRDs with special structures by simulation and proposed a new structure to farther improve the temperature coefficient of the FRDs. It is found that, a diode with low P+ emitter efficiency, and a P+ buried layer at anode junction has a better forward temperature coefficient. It proposes a guiding way to design the FRDs which are worked in the positive temperature coefficient (PTC) area. ©2010 IEEE.

关键词:

Temperature distribution Positive temperature coefficient Semiconductor diodes

作者机构:

  • [ 1 ] [Wu, Zhenxing]Lab. of Power Semiconductor Devices and Ics, Beijing University of Technology, Beijing, China
  • [ 2 ] [Wu, Yu]Lab. of Power Semiconductor Devices and Ics, Beijing University of Technology, Beijing, China
  • [ 3 ] [Jia, Yunpeng]Lab. of Power Semiconductor Devices and Ics, Beijing University of Technology, Beijing, China
  • [ 4 ] [Tian, Feifei]Lab. of Power Semiconductor Devices and Ics, Beijing University of Technology, Beijing, China
  • [ 5 ] [Liu, Yin]Lab. of Power Semiconductor Devices and Ics, Beijing University of Technology, Beijing, China
  • [ 6 ] [Liu, Yueyang]Lab. of Power Semiconductor Devices and Ics, Beijing University of Technology, Beijing, China

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ISSN: 2157-4839

年份: 2010

语种: 英文

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WoS核心集被引频次: 0

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