P3-37: Emission characteristics of Sc- doped dispenser cathodes in electron gun open structures - 文章详情页

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摘要：

Emission　properties　of　Scandia　Doped　Dispenser　(SDD)　cathodes　tested　in　Pierce　Gun　open　structures　have　been　reported　in　this　paper.　80-100　A/cm　2　Space　-　Charge　Limited　(　SCL)　current　densities　have　been　obtained　at　designed　anode　voltages　and　normal　operating　temperatures　for　cathodes　with　either　flat　surfaces　or　concave　surfaces.　The　influences　of　anode　effects　on　cathodes,　which　appear　in　close　-　spaced　diodes,　are　discussed　in　the　paper.　©　2010　IEEE.

关键词：

Vacuum technology Thermionic emission Electron guns Dispensers Anodes Cathodes

作者机构：

[ 1 ] [Liu, Wei]School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
[ 2 ] [Wang, Yiman]School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
[ 3 ] [Zhao, Lei]School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
[ 4 ] [Li, Lili]School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
[ 5 ] [Zhang, Xizhu]School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
[ 6 ] [Wang, Jinshu]School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China

通讯作者信息：

查看成果更多字段

Correlation of emission behavior and surface feature of scandia doped dispenser cathodes
2008，2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC
Emission characteristics of nanosized-scandia doped dispenser cathodes at different operating modes
2011，
Investigation on robustness of Nanosized-Scandia Doped Dispenser Cathodes
2016，17th IEEE International Vacuum Electronics Conference, IVEC 2016
Characterization of scandate cathode emission
2009，2009 IEEE International Vacuum Electronics Conference, IVEC 2009

来源：

年份： 2010

页码： 403-404

语种：英文

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WoS核心集被引频次： 0

SCOPUS被引频次： 3

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归属院系：

材料与制造学部本学院/部未明确归属的数据

材料与制造学部材料科学与工程学院

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