The　contrastive　damage　experiments　of　CCD　irradiated　by　800nm　femtosecond　laser　with　the　pulse　duration　of　330fs　and　1064nm　laser　with　the　pulse　duration　of　10ns　were　studied　from　the　energy　density　and　power　density.　The　failure　problems　of　the　CCD　devices　irradiated　by　the　two　kinds　of　laser　pulses　were　studied.　The　experimental　results　show　that　the　failure　threshold　of　CCD　irradiated　by　femtosecond　laser　is　2.3　nJ　/　cm2　and　it　is　34　order　lower　than　that　by　nanosecond　laser.　According　to　the　micro-analysis　of　CCD,　it　is　found　that　the　damage　takes　place　at　the　light　activated　elements.　2009　SPIE.