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作者:

Zhang, Bin (Zhang, Bin.) | Su, Rong (Su, Rong.) | Feng, Shiwei (Feng, Shiwei.) (学者:冯士维) | Zhang, Guangchen (Zhang, Guangchen.) | Guo, Chunsheng (Guo, Chunsheng.) | Liu, Yin (Liu, Yin.) | Ding, Kaikai (Ding, Kaikai.)

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EI Scopus

摘要:

The thermal analysis of ICs has been studied in different methods for years. In this paper, a new method to analyze the steady-state temperature distribution of integrated circuit is presented. According to equivalent thermal resistance formula obtaining by an aid tool ANSYS and programming idea, the temperature distribution graph of an analog integrated circuit is obtained. And the result is verified by a complete ANSYS analysis. ©2009 IEEE.

关键词:

Analog integrated circuits Failure analysis Failure (mechanical) Temperature distribution Thermoanalysis

作者机构:

  • [ 1 ] [Zhang, Bin]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Su, Rong]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Feng, Shiwei]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Zhang, Guangchen]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Guo, Chunsheng]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Liu, Yin]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 7 ] [Ding, Kaikai]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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年份: 2009

页码: 538-540

语种: 英文

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