This　paper　analyzes　the　interaction　process　between　the　laser　beam　and　CCD　devices.　The　damage　effects　of　the　CCD　devices　irradiated　by　the　laser　was　observed.　We　give　a　comparative　analysis　of　femtosecond　laser　pulses　and　the　nanosecond　laser　pulse　induced　CCD　failure　threshold.　The　phenomena　of　saturation,　cross-talk　and　totally　damage　were　observed　and　the　corresponding　failure　thresholds　were　measured,　microscope　was　used　to　analyze　the　damage　mechanism　of　CCD　after　experiments.　The　experimental　results　showed　that　the　failure　threshold　of　CCD　was　not　only　affected　by　the　power　density　and　the　energy　density　but　also　by　the　peak　power　density,　which　was　more　important　comparatively.　This　work　will　supply　reference　to　the　study　on　mutual　effects　with　laser　and　CCD　detectors.