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作者:

Yuanchun, Wang (Yuanchun, Wang.) | Weidong, Ma (Weidong, Ma.) | Changzhi, Lv (Changzhi, Lv.) | Zhiguo, Li (Zhiguo, Li.) | Chunsheng, Guo (Chunsheng, Guo.) | Fei, Li (Fei, Li.)

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EI Scopus

摘要:

Ever-increasing DC/DC power density and peak temperature challenge its reliability and performance. Thermal simulation and analysis playa significant role in development of new generation of DC/DC package design. This paper presents an accurate and fast approach to simulate the thermal distribution of a DC/DC module. The thermal distribution is simulated with ANSYS, and verified by infrared thermal images. This made feasible the thermal design to reduce stressing temperature peaks, so improving DC/DC reliability significantly. © 2009 IEEE.

关键词:

Thermoanalysis Outages Failure (mechanical) Integrated circuits Failure analysis

作者机构:

  • [ 1 ] [Yuanchun, Wang]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Weidong, Ma]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Changzhi, Lv]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Zhiguo, Li]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Chunsheng, Guo]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Fei, Li]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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年份: 2009

页码: 410-413

语种: 英文

被引次数:

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SCOPUS被引频次: 2

ESI高被引论文在榜: 0 展开所有

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