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作者:

Guangchen, Zhang (Guangchen, Zhang.) | Shiwei, Feng (Shiwei, Feng.) (学者:冯士维) | Lu, Wang (Lu, Wang.) | Chunsheng, Guo (Chunsheng, Guo.) | Xuesong, Xie (Xuesong, Xie.) | Chenning, Ge (Chenning, Ge.)

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摘要:

In this paper, thermal management of the multi-chip vertical packaged (MCVP) white LED is presented. The steady state thermal resistance (RT) and thermal resistance constitution is obtained by transient response testing based on electrical method. RT is 10.37C /W. The chips and package body contributes 2.63C /W and 7.74 /W respectively. The temperature distribution of the MCVP LED is obtained by 3-dimensional finite element method (FEM) simulation. By comparing heating response curves among different package forms' LED samples, the MCVP sample shares lowest steady state temperature rise with the metal alloyed substrate sample, which is lower than 18.3 of the single flip-chip sub-mounted device (SMD) sample and 15.3 of the multi-chip horizontal packaged (MCHP) sample. ©2009 IEEE.

关键词:

Microprocessor chips Thermoanalysis Photonics Transient analysis Light emitting diodes Reliability Flip chip devices Heat resistance

作者机构:

  • [ 1 ] [Guangchen, Zhang]School of Electronic Information and Control Engineering, Beijing University of Technology, 100124 Beijing, China
  • [ 2 ] [Shiwei, Feng]School of Electronic Information and Control Engineering, Beijing University of Technology, 100124 Beijing, China
  • [ 3 ] [Lu, Wang]School of Electronic Information and Control Engineering, Beijing University of Technology, 100124 Beijing, China
  • [ 4 ] [Chunsheng, Guo]School of Electronic Information and Control Engineering, Beijing University of Technology, 100124 Beijing, China
  • [ 5 ] [Xuesong, Xie]School of Electronic Information and Control Engineering, Beijing University of Technology, 100124 Beijing, China
  • [ 6 ] [Chenning, Ge]School of Electronic Information and Control Engineering, Beijing University of Technology, 100124 Beijing, China

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年份: 2009

语种: 英文

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SCOPUS被引频次: 1

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