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作者:

An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) (学者:秦飞)

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EI Scopus

摘要:

In this paper, the damage fracture of solder joints in board level electronic package subjected to drop impact loadings was numerically simulated by the finite element method and the cohesive zone model. The solder-Cu pad interface was modeled by cohesive zone elements. The results show that fracture initiates at the edge of the PCB side and the damage of solder joint is affected greatly by the used material constitutive model in the simulation. ©2009 IEEE.

关键词:

Electronics packaging Fracture Packaging

作者机构:

  • [ 1 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China

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年份: 2009

页码: 260-266

语种: 英文

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 2

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