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作者:

An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) (学者:秦飞)

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EI Scopus

摘要:

The reliability of board level electronic package subjected to drop impact loadings is one of the most concerned issues. In this paper, a standard board level drop impact test was modeled as double cantilever beam model. The deflection and curvature of the Printed Circuit Board (PCB) and the component were compared with that derived from static analysis in order to understand the influence of dynamic response of the PCB on the solder joints. The results show that the difference of flexibility between the PCB and the package is the main driver for solder joint stress; the dynamic response of the PCB observably affects the stress in solder joints. ©2009 IEEE.

关键词:

Cantilever beams Drops Dynamic response Electronics packaging Packaging Printed circuit boards

作者机构:

  • [ 1 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China

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年份: 2009

页码: 370-374

语种: 英文

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WoS核心集被引频次: 0

SCOPUS被引频次: 1

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