VLSI fault diagnosis research based on infrared imaging - 文章详情页

作者：

Yuan, Haiying (Yuan, Haiying.) | Wang, Tieliu (Wang, Tieliu.) | Lei, Fei (Lei, Fei.) | Chen, Dongsheng (Chen, Dongsheng.) (学者：陈东升)

收录：

EI Scopus

摘要：

The　fault　diagnosis　method　of　VLSI　based　on　infrared　imaging　scan　technique　is　described.　During　integrate　circuit　working,　the　power　supply　dissipation　from　each　part　is　regarded　as　fault　information,　the　fault　feature　extraction　is　completed　by　infrared　imaging　acquiring　and　imaging　processing,　the　fault　pattern　classification　is　realized　by　neurons　network.　The　method　can　solve　the　fault　diagnosis　problem　of　very　large　scale　integrate　circuit　with　power　dissipation.　The　results　show　that　the　diagnosis　method　is　feasible.

关键词：

Classification (of information) Computer aided diagnosis Electric losses Failure analysis Fault detection Infrared imaging Pattern recognition Thermography (imaging) VLSI circuits

作者机构：

[ 1 ] [Yuan, Haiying]Electronic Engineer and Control School, Beijing University of Technology, Beijing 100124, China
[ 2 ] [Wang, Tieliu]Electronic Engineer and Control School, Beijing University of Technology, Beijing 100124, China
[ 3 ] [Lei, Fei]Electronic Engineer and Control School, Beijing University of Technology, Beijing 100124, China
[ 4 ] [Chen, Dongsheng]Electronic Engineer and Control School, Beijing University of Technology, Beijing 100124, China

通讯作者信息：

电子邮件地址：

查看成果更多字段

成果类型
所属机构

所有年份指定年份从至