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作者:

Zhang, Guangchen (Zhang, Guangchen.) | Feng, Shiwei (Feng, Shiwei.) (学者:冯士维) | Wang, Lu (Wang, Lu.) | Xie, Xuesong (Xie, Xuesong.) | Gao, Lichao (Gao, Lichao.) | Meng, Haijie (Meng, Haijie.)

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EI Scopus

摘要:

The reliability of power LEDs has strong dependence on successful package thermal management. In this paper, heating response curves of LEDs were recorded by the temperature sensitive parameter (TSP) method and fast-switching circuit techniques. It provided a novel method to analyze thermal resistance composition of power LED's packaging. Cover-and-block method was presented to provide a correction to the apparent thermal resistance of optical devices, and an electrical method to obtain radiant efficiency was also put forward. © 2008 IEEE.

关键词:

Efficiency Heat resistance Integrated circuits Light emitting diodes Reliability

作者机构:

  • [ 1 ] [Zhang, Guangchen]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Feng, Shiwei]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wang, Lu]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Xie, Xuesong]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Gao, Lichao]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Meng, Haijie]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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来源 :

年份: 2008

页码: 1211-1214

语种: 英文

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 4

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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