• 综合
  • 标题
  • 关键词
  • 摘要
  • 学者
  • 期刊-刊名
  • 期刊-ISSN
  • 会议名称
搜索

作者:

Zhang, Guangchen (Zhang, Guangchen.) | Feng, Shiwei (Feng, Shiwei.) (学者:冯士维) | Wang, Lu (Wang, Lu.) | Xie, Xuesong (Xie, Xuesong.) | Gao, Lichao (Gao, Lichao.) | Meng, Haijie (Meng, Haijie.)

收录:

EI Scopus

摘要:

The reliability of power LEDs has strong dependence on successful package thermal management. In this paper, heating response curves of LEDs were recorded by the temperature sensitive parameter (TSP) method and fast-switching circuit techniques. It provided a novel method to analyze thermal resistance composition of power LED's packaging. Cover-and-block method was presented to provide a correction to the apparent thermal resistance of optical devices, and an electrical method to obtain radiant efficiency was also put forward. © 2008 IEEE.

关键词:

Efficiency Heat resistance Integrated circuits Light emitting diodes Reliability

作者机构:

  • [ 1 ] [Zhang, Guangchen]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Feng, Shiwei]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wang, Lu]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Xie, Xuesong]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Gao, Lichao]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Meng, Haijie]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

通讯作者信息:

电子邮件地址:

查看成果更多字段

相关关键词:

来源 :

年份: 2008

页码: 1211-1214

语种: 英文

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 4

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

近30日浏览量: 2

归属院系:

在线人数/总访问数:237/2892274
地址:北京工业大学图书馆(北京市朝阳区平乐园100号 邮编:100124) 联系我们:010-67392185
版权所有:北京工业大学图书馆 站点建设与维护:北京爱琴海乐之技术有限公司