White-light　interferometric　technique　has　been　widely　applied　in　the　measurement　of　three-dimensional　profiles　and　roughness　with　high-precision.　Based　on　the　characteristic　of　interferometric　technique,　a　new　method　combined　with　image　location　and　a　three-dimensional　stage　is　proposed　to　achieve　the　non-contact　absolute　shape　measurement　for　aspheric　and　spherical　surface　in　a　slarge　range.　The　interference　fringes　vary　with　the　horizontal　displacement　of　the　measured　surface,　the　surface　information　was　obtained　by　locating　the　transformation　of　the　maximal　intensity　in　the　interferograms.　Two　main　influence　factors　are　discussed;　they　are　performance　of　the　inerferimetric　microscope　and　the　stage.　Since　the　performance　of　the　stage　directly　determines　the　measurement　precision,　a　three-dimensional　displacement　stage　with　a　large　range　and　a　high　precision　was　developed.　Some　experiments　were　carried　out　to　verify　the　performance　of　the　three-dimensional　displacement　stage　and　the　validity　of　the　new　measurement　method　with　satisfactory　results.