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作者:

Jin, Dong-Yue (Jin, Dong-Yue.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Xie, Hong-Yun (Xie, Hong-Yun.) | Wang, Yang (Wang, Yang.)

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EI Scopus

摘要:

Based on a three-dimensional thermal-electrical model, non-uniform finger spacing power SiGe HBT was designed and fabricated. Experiment result shows that the peak temperature of non-uniform spacing SiGe HBT is lowed by 22K compared with that of uniform space HBT. For the same non-uniform spacing HBT, temperature non-uniformity among the fingers is improved obviously at different biases. The higher power dissipation PDC is, the better temperature improvement of non-uniform spacing HBT is. Because of the reducing of peak temperature, power SiGe HBTs with non-uniform Spacing can work at higher bias and has higher power handling capability.

关键词:

Thermal effects Silicon compounds Energy dissipation Heterojunction bipolar transistors

作者机构:

  • [ 1 ] [Jin, Dong-Yue]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Zhang, Wan-Rong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Xie, Hong-Yun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Wang, Yang]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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来源 :

年份: 2007

语种: 英文

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WoS核心集被引频次: 0

SCOPUS被引频次: 1

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