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作者:

Liu, B.D. (Liu, B.D..) | Guan, J.L. (Guan, J.L..) | Li, D.Sh. (Li, D.Sh..) | Li, H.Q. (Li, H.Q..)

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摘要:

The removal of redundant layer of deposited metal of the micro coils is one difficult problem in the fabricating of micro-mechanical electromagnetic relay. In view of the machining efficiency and quality, the paper introduced lapping and polishing technology. The paper also analyzed the characteristic of lapping and polishing and introduced the appropriate abrasives. Then the main procedures were presented and the measuring result was given in the paper. The surface roughness of the coil could satisfy the next layer fabricate requirements of the micro-mechanical electromagnetic relay. At last the paper concluded the optimized lapping and polishing parameters.

关键词:

Lapping Microelectromechanical devices Polishing Silicon wafers Surface roughness

作者机构:

  • [ 1 ] [Liu, B.D.]Beijing University of Technology, Beijing, 100022, China
  • [ 2 ] [Guan, J.L.]Beijing University of Technology, Beijing, 100022, China
  • [ 3 ] [Li, D.Sh.]Beijing University of Technology, Beijing, 100022, China
  • [ 4 ] [Li, H.Q.]Beijing University of Technology, Beijing, 100022, China

通讯作者信息:

  • [liu, b.d.]beijing university of technology, beijing, 100022, china

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来源 :

ISSN: 1013-9826

年份: 2006

卷: 304-305

页码: 422-425

语种: 英文

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