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作者:

Qiu, Jianjun (Qiu, Jianjun.) | Zhang, Wanrong (Zhang, Wanrong.) | Jin, Dongyue (Jin, Dongyue.) | Yang, Jingwei (Yang, Jingwei.) | Gao, Pan (Gao, Pan.) | Liu, Ying (Liu, Ying.)

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EI

摘要:

Multi-finger structure is commonly used in microwave power GeSi HBTs (Heterojunction Bipolar Transistors). Usually equally valued emitter ballasting resistors are added to improve thermal stability of the devices. However, self-heating and thermal coupling effects make the temperature distribution on emitter fingers non-uniform, so the equally valued ballasting resistors structure is not optimum. In this paper, an unequally valued ballasting resistors structure is presented, which could improve the uniformity of devices' temperature distribution effectively, and decrease the highest temperature to a certain extent.

关键词:

Heterojunction bipolar transistors Heterojunctions Resistors Si-Ge alloys Structural optimization Temperature distribution Thermodynamic stability

作者机构:

  • [ 1 ] [Qiu, Jianjun]School of Electronics Information and Control Engineering, Beijing University of Technology, Beijing, 100022, China
  • [ 2 ] [Zhang, Wanrong]School of Electronics Information and Control Engineering, Beijing University of Technology, Beijing, 100022, China
  • [ 3 ] [Jin, Dongyue]School of Electronics Information and Control Engineering, Beijing University of Technology, Beijing, 100022, China
  • [ 4 ] [Yang, Jingwei]School of Electronics Information and Control Engineering, Beijing University of Technology, Beijing, 100022, China
  • [ 5 ] [Gao, Pan]School of Electronics Information and Control Engineering, Beijing University of Technology, Beijing, 100022, China
  • [ 6 ] [Liu, Ying]School of Electronics Information and Control Engineering, Beijing University of Technology, Beijing, 100022, China

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来源 :

年份: 2006

页码: 890-893

语种: 英文

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