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作者:

Song, G.Q. (Song, G.Q..) | Shi, X.Q. (Shi, X.Q..) | Qin, F. (Qin, F..) (学者:秦飞) | He, C.F. (He, C.F..) (学者:何存富)

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EI Scopus

摘要:

In this study, fracture tests of chip/underfill/chip sandwiched system were carried out, with non-contact and non-destructive digital image correlation (DIC) technique, under various loading angles from 20° to 90° for different temperature levels of 25, 75 and 125°C or after moisture ageing at 85°C/85%RH, to study the effects of loading angle, temperature and moisture on the interface fracture toughness. With the results, the mode I and mode II critical fracture toughness based failure assessment diagrams (FADs) were established for reliability design and failure assessment of underfill/chip interface at different thermal cycling loading and moisture conditions. © 2006 IEEE.

关键词:

Correlation methods Failure (mechanical) Fracture toughness Image processing Interfaces (materials) Loads (forces) Microprocessor chips Moisture Thermal effects

作者机构:

  • [ 1 ] [Song, G.Q.]School of Civil Engineering, Nanchang University, 339 East Beijing Rd., Nanchang, Jiangxi 330029, China
  • [ 2 ] [Shi, X.Q.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, No. 100, Pingleyuan, Chaoyang, Beijing 100022, China
  • [ 3 ] [Qin, F.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, No. 100, Pingleyuan, Chaoyang, Beijing 100022, China
  • [ 4 ] [He, C.F.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, No. 100, Pingleyuan, Chaoyang, Beijing 100022, China

通讯作者信息:

  • [song, g.q.]school of civil engineering, nanchang university, 339 east beijing rd., nanchang, jiangxi 330029, china

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年份: 2006

卷: 2006

页码: 1147-1152

语种: 英文

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WoS核心集被引频次: 0

SCOPUS被引频次: 20

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