A　new　crystal　spectrometer　has　been　designed　and　fabricated　for　measuring　laser-plasma　x-ray　in　the　0.99-1.83-nm　region.　The　cleaved　mica　crystal　with　0.2-mm　thickness　was　curved　and　glued　on　an　elliptical　substrate　as　the　dispersive　element.　The　x-ray　source　and　exit　slit　are　respectively　placed　at　the　first　and　second　focal　point　of　the　elliptical　crystal.　The　x-ray　is　diffracted　by　the　mica　crystal　and　focused　at　the　exit　slit.　An　x-ray　sensitive　charge　coupled　device　or　streak　camera　can　be　easily　amounted　in　the　perpendicular　orientation　to　record　the　space　and　time　resolved　x-ray　spectra.　The　spectrometer　was　tested　at　the　XG-2　laser　facility,　and　the　experimental　result　shows　that　the　maximum　spectral　resolution　is　999.