Since　its　first　application　toward　displacement　measurements　in　the　early-1960s,　laser　feedback　interferometry　has　become　a　fast-developing　precision　measurement　modality　with　many　kinds　of　lasers.　By　employing　the　frequency-shifted　optical　feedback,　microchip　laser　feedback　interferometry　has　been　widely　researched　due　to　its　advantages　of　high　sensitivity,　simple　structure,　and　easy　alignment.　More　recently,　the　laser　confocal　feedback　tomography　has　been　proposed,　which　combines　the　high　sensitivity　of　laser　frequency-shifted　feedback　effect　and　the　axial　positioning　ability　of　confocal　microscopy.　In　this　paper,　the　principles　of　a　laser　frequency-shifted　optical　feedback　interferometer　and　laser　confocal　feedback　tomography　are　briefly　introduced.　Then　we　describe　their　applications　in　various　kinds　of　metrology　regarding　displacement　measurement,　vibration　measurement,　physical　quantities　measurement,　imaging,　profilometry,　microstructure　measurement,　and　so　on.　Finally,　the　existing　challenges　and　promising　future　directions　are　discussed.